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In this video, John Tucker from Tektronix presents their advanced Double Pulse Testing System, crucial for identifying RDS(on) in silicon carbide and gallium nitride devices. Featuring MSO 5 Series oscilloscopes, function generators, and Keithley units, this system ensures precise measurements and reliable performance validation for cutting-edge semiconductor technologies.
The post Introducing Tektronix’s Advanced Double Pulse Testing System appeared first on Power Electronics News.
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